Microelectronics Reliability RSS feed (table of contents alerts)
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Journal facts
ISSN
0026-2714 · 1872-941X
Works in OpenAlex
31,083
h-index
132
2-year mean citedness
2.53
Open access
no
APC (USD)
2,280
Country
GB
Data: OpenAlex (CC0) and DOAJ (CC0). · Journal homepage · OpenAlex
Topics
EngineeringElectrical and Electronic EngineeringSemiconductor materials and devices
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